Fracture and Structural Integrity e-ISSN 1971-8993 Open access
SI: Crack Paths Vol. 13, No. 47 (2019)

Experimental characterization at nanoscale of single crystal silicon fracture toughness

Author and affiliation details
DOI
10.3221/IGF-ESIS.47.31
Pages
408-415
Published

Abstract

The work reviews some preliminary recent micromechanical tests aimed at the evaluation of the fracture toughness of silicon. Pre-cracked nano specimens and alternatively notched nano specimens combined with the theory of critical distances (TCD) are compared. The results show that the fracture toughness of silicon is approximately 1 MPa·m0.5, regardless of the procedure involved (i.e., pre-cracked samples or TCD). This value agrees with macro counterpart, i.e., 0.75-1.08 MPa·m0.5, and therefore the KIC is independent of the size and crystal orientation. However, by employing the TCD, the accurate control of the final crack tip which is currently very challenging, is overcome by using notched specimens. Additionally, the results give information about the crack propagation at the nanoscale. It seems that although the specimen axis deviates from the (011), the crack propagates along the cleavage plane (011) and the process develops very fast by breaking covalent bond at the crack tip. A brief discussion on beyond the breakdown of continuum theory and challenges toward nanometer scale fracture mechanics concludes the paper.

Keywords

Article history

  1. ReceivedUntil the next stage: 9 days
  2. Revision requestedUntil the next stage: 2 days
  3. RevisedUntil the next stage: 0 days
  4. AcceptedUntil the next stage: 27 days
  5. Published

How to cite

APA

Gallo, P., Sumigawa, T., & Kitamura, T. (2018). Experimental characterization at nanoscale of single crystal silicon fracture toughness. Fracture and Structural Integrity, 13(47), 408–415. https://doi.org/10.3221/IGF-ESIS.47.31

IEEE

P. Gallo, T. Sumigawa, and T. Kitamura, “Experimental characterization at nanoscale of single crystal silicon fracture toughness,” Fracture and Structural Integrity, vol. 13, no. 47, pp. 408–415, 2018, doi: 10.3221/IGF-ESIS.47.31.

MLA

Gallo, Pasquale, et al. “Experimental characterization at nanoscale of single crystal silicon fracture toughness.” Fracture and Structural Integrity, vol. 13, no. 47, 2018, pp. 408–415. https://doi.org/10.3221/IGF-ESIS.47.31.

Chicago

Gallo, Pasquale, Takashi Sumigawa, and Takayuki Kitamura. 2018. “Experimental characterization at nanoscale of single crystal silicon fracture toughness.” Fracture and Structural Integrity 13 (47): 408–415. https://doi.org/10.3221/IGF-ESIS.47.31.

Harvard

Gallo, P., Sumigawa, T. and Kitamura, T. (2018) ‘Experimental characterization at nanoscale of single crystal silicon fracture toughness’, Fracture and Structural Integrity, 13(47), pp. 408–415. doi: 10.3221/IGF-ESIS.47.31.

Vancouver

Gallo P, Sumigawa T, Kitamura T. Experimental characterization at nanoscale of single crystal silicon fracture toughness. Fracture and Structural Integrity. 2018;13(47):408-415. doi:10.3221/IGF-ESIS.47.31

BibTeX

@article{gallo2018, author = {Gallo, Pasquale and Sumigawa, Takashi and Kitamura, Takayuki}, title = {Experimental characterization at nanoscale of single crystal silicon fracture toughness}, journal = {Fracture and Structural Integrity}, year = {2018}, volume = {13}, number = {47}, pages = {408--415}, doi = {10.3221/IGF-ESIS.47.31}, url = {https://doi.org/10.3221/IGF-ESIS.47.31}, issn = {1971-8993} }

RIS

TY - JOUR AU - Gallo, Pasquale AU - Sumigawa, Takashi AU - Kitamura, Takayuki TI - Experimental characterization at nanoscale of single crystal silicon fracture toughness JO - Fracture and Structural Integrity T2 - Fracture and Structural Integrity PY - 2018 DA - 2018/12/04 VL - 13 IS - 47 SP - 408 EP - 415 DO - 10.3221/IGF-ESIS.47.31 UR - https://doi.org/10.3221/IGF-ESIS.47.31 SN - 1971-8993 ER -

Licence

Copyright © 2019 Pasquale Gallo, Takashi Sumigawa, Takayuki Kitamura.

Copyright 
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